Element | Region (eV) | Date | Reference or Comment
|
Mg | 10-1300 | January 2011 | Manuela Vidal-Dasilva, Andrew L. Aquila, Eric M. Gullikson, Farhad Salmassi, Juan I. Larruquert. Optical constants of magnetron-sputtered magnesium films in the 25-1300 eV energy range. J. Appl. Phys. 108, 063517 (2010). |
Zr | 20-1000 | April 2010 | Updated values based on measurements performed at ALS beamline 6.3.2. |
Ta | 20-1000 | 2009 | Updated values based on measurements performed at ALS beamline 6.3.2. |
La | 14-440 | June 2007 | J.F. Seely, Yu.A. Uspenskii, B. Kjornrattanawanich and D.L. Windt. Coated Photodiode Technique for the Determination of the Optical Constants of Reactive Elements: La and Tb. SPIE Proceedings 6317, OT (August 2006). |
Gd | 12-450 | June 2007 | B. Kjornrattanawanich, D.L. Windt, Yu.A. Uspenskii, and J.F. Seely. Optical Constants Determination of Neodymiun and Gadolinium in the 3 nm to 100 nm wavelength range. SPIE Proceedings 6317, OU (August 2006). |
Sc | 50-1300 | April 2006 | A.L. Aquila, F. Salmassi, E.M. Gullikson, F. Eriksson, J. Birch. Measurements of the Optical Constants of Scandium in the 50-1300eV Range. SPIE Proceedings 5538, 64 (July 2004). |
Sc | 20-70 | April 2006 | Yu.A. Uspenskii, J.F. Seely, N.I. Popov, A.V. Vinogradov, Yu.P. Pershin V.V. Kondratenko. Efficient method for the determination of extreme ultraviolet optical constants in reactive materials: application to scandium and titanium. J. Opt. Soc. Am. A 21, 298 (2004). |
Ti | 20-150 | Aug 2004 | Yu.A. Uspenskii, J.F. Seely, N.I. Popov, A.V. Vinogradov, Yu.P. Pershin V.V. Kondratenko. Efficient method for the determination of extreme ultraviolet optical constants in reactive materials: application to scandium and titanium. J. Opt. Soc. Am. A 21, 298 (2004). |
Ru | 40-1300 | Aug 2004 | U. Schlegel.
Determination of the optical constants of Ruthenium
in the EUV and soft x-ray region using synchrotron radiation.
Diploma thesis, Technische Fachhochschule Berlin (May 2000).
|
W | 35-150 | Aug 2004 | C. Tarrio, R. N. Watts, T.B. Lucatorto, J.M. Slaughter, C.M. Falco.
Optical constants of in situ-deposited films of important
extreme-ultraviolet multilayer mirror materials.
Applied Optics 37, 4100 (1998).
|
Mo | 25-60 | Aug 2004 | C. Tarrio, R. N. Watts, T.B. Lucatorto, J.M. Slaughter, C.M. Falco.
Optical constants of in situ-deposited films of important
extreme-ultraviolet multilayer mirror materials.
Applied Optics 37, 4100 (1998).
|
Be | 40-250 | Aug 2004 | R. Soufli, S. Bajt and E.M. Gullikson.
Optical constants of beryllium from photoabsorption
measurements for X-ray optics applications.
SPIE Proceedings 3767, 251-8 (1999).
|
Mo | 10-930 | Nov 1997 | R. Soufli and E. M. Gullikson.
Absolute photoabsorption measurements of molybdenum in the range
60 to 930 eV for optical constant determination.
Applied Optics 37, 1713-1719 (1998).
|
Fe | 600-800 | Oct 1995 | Revised data in the vicinity of the L edge.
|
Si | 30-500 | June 1995 | R. Soufli and E. M. Gullikson. Reflectance measurements
on clean surfaces for the determination of optical constants of
materials in the EUV/soft x-ray region.
Applied Optics 36, 5499-5507 (1997).
|
Au | 2000-6500 | July 1994 | C. S. Nelson, T. H. Markert, Y. S. Song, H. L. Marshall,
M. L. Schattenburg, D. E. Graessle, K. A. Flanagan, R. L. Blake,
J. Bauer, E. M. Gullikson.
Efficiency measurements and modeling of the Advanced X-ray
Astrophysics Facility (AXAF) high-energy transmission gratings.
Proceedings of the SPIE Vol. 2280, 191-203 (July 1994).
|
Mg, Al, Si | 30-200 | Jan 1994 | E. M. Gullikson, P. Denham, S. Mrowka, J. H. Underwood,
"Absolute photoabsorption measurements of Mg, Al, and Si
in the soft-X-ray region below the L2,3 edges",
Physical Review B 49, 16283-8 (15 June 1994).
|
Li | 2000-30000 | Nov 1994 | Corrected data above 2000 eV for Compton cross section. |
The values for all the elements have been revised by the addition of data points 0.1 eV above and below sharp absorption edges. Note that the revised values of f1 will have changed over a somewhat larger energy region in the vicinity of sharp edges.